Preprint
Robust Estimators and Test-Statistics for One-Shot Device Testing Under the Exponential Distribution
Abstract
This paper develops a new family of estimators, the minimum density power
divergence estimators (MDPDEs), for the parameters of the one-shot device model
Authors
Balakrishnan N; Castilla E; Martin N; Pardo L
Publication date
April 25, 2017
DOI
10.48550/arxiv.1704.07865
Preprint server
arXiv