Stacking defects in GaP nanowires: Electronic structure and optical properties
Abstract
Formation of twin boundaries during the growth of semiconductor nanowires is
very common. However, the effects of such planar defects on the electronic and
optical properties of nanowires are not very well understood. Here, we use a
combination of ab initio simulation and experimental techniques to study these
effects. Twin boundaries in GaP are shown to act as an atomically-narrow plane
of wurtzite phase with a type-I homostructure band alignment. Twin boundaries
and stacking faults (wider regions of the wurtzite phase) lead to the
introduction of shallow trap states observed in photoluminescence studies.
These effects should have a profound impact on the efficiency of nanowire-based
devices.