Journal article
A New Method for Goodness-of-Fit Testing Based on Type-II Right Censored Samples
Abstract
Authors
Lin C-T; Huang Y-L; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 57, No. 4, pp. 633–642
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2008
DOI
10.1109/tr.2008.2005860
ISSN
0018-9529