Journal article
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
Abstract
Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more …
Authors
Tseng S-T; Balakrishnan N; Tsai C-C
Journal
IEEE Transactions on Reliability, Vol. 58, No. 4, pp. 611–618
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2009
DOI
10.1109/tr.2009.2033734
ISSN
0018-9529