Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
Optimal Step-Stress Accelerated Degradation Test...
Journal article

Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes

Abstract

Step-stress accelerated degradation testing (SSADT) is a useful tool for assessing the lifetime distribution of highly reliable products (under a typical-use condition) when the available test items are very few. Recently, an optimal SSADT plan was proposed based on the assumption that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more …

Authors

Tseng S-T; Balakrishnan N; Tsai C-C

Journal

IEEE Transactions on Reliability, Vol. 58, No. 4, pp. 611–618

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

December 1, 2009

DOI

10.1109/tr.2009.2033734

ISSN

0018-9529