Journal article
A General Purpose Approximate Goodness-of-Fit Test for Progressively Type-II Censored Data
Abstract
We propose a general purpose approximate goodness-of-fit test that covers several families of distributions under progressive Type-II censored data. The test procedure is based on the empirical distribution function (EDF), and generalizes the goodness-of-fit test proposed by Chen and Balakrishnan [11] to progressively Type-II censored data. The new method requires some tables for critical values, which are constructed by Monte Carlo simulation. …
Authors
Pakyari R; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 61, No. 1, pp. 238–244
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2012
DOI
10.1109/tr.2012.2182811
ISSN
0018-9529