Journal article
Optimal Design for Degradation Tests based on Gamma Processes with Random Effects
Abstract
Degradation models are usually used to provide information about the reliability of highly reliable products that are not likely to fail within a reasonable period of time under traditional life tests, or even accelerated life tests. The gamma process is a natural model for describing degradation paths, which exhibit a monotone increasing pattern, while the commonly used Wiener process is not appropriate in such a case. We discuss the problem …
Authors
Tsai C-C; Tseng S-T; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 604–613
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/tr.2012.2194351
ISSN
0018-9529