Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

In reliability analysis, accelerated life-tests are commonly used for inducing more failures, thus obtaining more lifetime information in a relatively short period of time. in this paper, we study binary response data collected from an accelerated life-test arising from one-shot device testing based on a Weibull lifetime distribution with both scale and shape parameters varying over stress factors. Log-linear link functions are used to connect …