Gamma lifetimes and one-shot device testing analysis

Gamma distribution is widely used to model lifetime data in reliability and survival analysis. In the context of one-shot device testing, encountered commonly in testing devices such as munitions, rockets, and automobile air-bags, either left- or right-censored data are collected instead of actual lifetimes of the devices under test. The destructive nature of one-shot devices makes it difficult to collect sufficient lifetime information on the …