Journal article
Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data
Abstract
In this article, a general goodness of fit test is developed by using a new estimate of Kullback-Leibler (KL) information based on Type-II censored data. The proposed test is consistent, and the test statistic is nonnegative, just like KL information. Then, the test statistic is used to test for exponentiality based on Type-II censored data. Through a simulation study, power values of the proposed test are compared with some prominent existing …
Authors
Noughabi HA; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 64, No. 2, pp. 627–635
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2015
DOI
10.1109/tr.2014.2366763
ISSN
0018-9529