Journal article
A Bayesian Approach for One-Shot Device Testing with Exponential Lifetimes Under Competing Risks
Abstract
This paper considers a competing risk model for a one-shot device testing analysis under an accelerated life test setting. Due to the consideration of competing risks, the joint posterior distribution becomes quite complicated. The Metropolis-Hastings sampling method is used for the estimation of the posterior means of the variables of interest. A simulation study is carried out to assess the Bayesian approach with different priors, and also to …
Authors
Balakrishnan N; So Y; Ling MH
Journal
IEEE Transactions on Reliability, Vol. 65, No. 1, pp. 469–485
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2016
DOI
10.1109/tr.2015.2440235
ISSN
0018-9529