Journal article
Reliability sampling plans for lognormal distribution, based on progressively-censored samples
Abstract
This paper presents reliability sampling plans for the lognormal distribution based on progressively censored samples. In constructing these sampling plans, large-sample approximations to the best linear unbiased estimators of the location and scale parameters are used. For some selected progressive censoring schemes, reliability sampling plans are tabulated for p/sub /spl alpha// and p/sub /spl beta// to match MIL-STD-105. While in general, …
Authors
Balasooriya U; Balakrishnan N
Journal
IEEE Transactions on Reliability, Vol. 49, No. 2, pp. 199–203
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 2000
DOI
10.1109/24.877338
ISSN
0018-9529