Journal article
Half-life of 176Lu
Abstract
The half-life of 176Lu has been measured using a γ-γ coincidence technique and was found to be T1/2=(4.08±0.03)×1010 years. The method employed eliminates most of the uncertainties associated with detector efficiencies, solid angle coverage, internal conversion, self-absorption, angular correlations, and true coincidence summing.
Authors
Grinyer GF; Waddington JC; Svensson CE; Austin RAE; Ball GC; Hackman G; O’Meara JM; Osborne C; Sarazin F; Scraggs HC
Journal
Physical Review C, Vol. 67, No. 1,
Publisher
American Physical Society (APS)
Publication Date
January 1, 2003
DOI
10.1103/physrevc.67.014302
ISSN
2469-9985