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Defect free strain relaxation of microcrystals on...
Journal article

Defect free strain relaxation of microcrystals on mesoporous patterned silicon

Abstract

A perfectly compliant substrate would allow the monolithic integration of high-quality semiconductor materials such as Ge and III-V on Silicon (Si) substrate, enabling novel functionalities on the well-established low-cost Si technology platform. Here, we demonstrate a compliant Si substrate allowing defect-free epitaxial growth of lattice mismatched materials. The method is based on the deep patterning of the Si substrate to form …

Authors

Heintz A; Ilahi B; Pofelski A; Botton G; Patriarche G; Barzaghi A; Fafard S; Arès R; Isella G; Boucherif A

Journal

Nature Communications, Vol. 13, No. 1,

Publisher

Springer Nature

DOI

10.1038/s41467-022-34288-4

ISSN

2041-1723