Film thickness dependent ordering dynamics of lamellar forming diblock copolymer thin films

Ellipsometry is used in a novel way to study the ordering dynamics of symmetric poly(styrene-methyl methacrylate) diblock copolymer thin films. Ordered thin films form lamellae parallel to the substrate which can form islands or holes at the free surface to ensure commensurability of the layers. The sensitivity of ellipsometry provides the unique ability to probe morphological changes during the ordering process before the ultimate formation of …