Journal article
Soft X-ray Spectromicroscopy at the Canadian Light Source
Authors
Wang J; Geilhufe J; Lu Y; Dynes JJ; Zhou J; Berg R; Leontowich AF; Coulthard I; Swirsky J; Karunakaran C
Journal
Microscopy and Microanalysis, Vol. 24, No. S2, pp. 228–229
Publisher
Oxford University Press (OUP)
Publication Date
August 2018
DOI
10.1017/s1431927618013491
ISSN
1431-9276