Chapter
Compositional dependence of the (200) electron diffraction in dilute III–V semiconductor solid solutions
Abstract
The quality of semiconductor mixed crystals is strongly dependent on the homogeneity of the distribution of the chemical constituencies. Cross-sectional dark-field transmission electron microscopy (DF TEM) provides an opportunity to access the chemical composition of the structures on the nanoscale.
Authors
Rubel O; Nemeth I; Stolz W; Volz K
Book title
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Pagination
pp. 223-224
Publisher
Springer Nature
Publication Date
2008
DOI
10.1007/978-3-540-85156-1_112