Journal article
LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm
Abstract
Application of Monte Carlo (MC) simulations in the statistical analysis of LED lumen maintenance is presented in this paper. Lumen maintenance data is acquired using experimental tests accomplished in the electro-optics laboratory of the Mazinoor lighting industry, which is an accredited laboratory by Iranian National Standards organization. The sampling rate and the duration of the experiments are consistent with LM-80-15 standard introduced …
Authors
Enayati J; Rahimnejad A; Gadsden SA
Journal
IEEE Transactions on Device and Materials Reliability, Vol. 21, No. 3, pp. 338–347
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
September 1, 2021
DOI
10.1109/tdmr.2021.3095244
ISSN
1530-4388