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RF CMOS RELIABILITY
Chapter

RF CMOS RELIABILITY

Authors

NASEH S; DEEN MJ

Book title

CMOS RF Modeling, Characterization and Applications

Series

Selected Topics in Electronics and Systems

Volume

24

Pagination

pp. 363-409

Publisher

World Scientific Publishing

Publication Date

April 2002

DOI

10.1142/9789812777768_0006