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HAADF STEM and EELS Investigations of Grain...
Journal article

HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Authors

Dudeck K; Couillard M; Cockayne D; Botton G

Journal

Microscopy and Microanalysis, Vol. 16, No. S2, pp. 1518–1519

Publisher

Oxford University Press (OUP)

Publication Date

7 2010

DOI

10.1017/s1431927610060198

ISSN

1431-9276