Journal article
Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Authors
Chang L; Maunders C; Baranova E; Bock C; Botton G
Journal
Microscopy and Microanalysis, Vol. 14, No. S2, pp. 426–427
Publisher
Oxford University Press (OUP)
Publication Date
8 2008
DOI
10.1017/s1431927608086728
ISSN
1431-9276