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High Resolution Characterization on Point Defects...
Journal article

High Resolution Characterization on Point Defects in (Pr,Al) Implanted SrTiO3

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Authors

Zhu G; Knights A; Botton G

Journal

Microscopy and Microanalysis, Vol. 17, No. S2, pp. 1632–1633

Publisher

Oxford University Press (OUP)

Publication Date

July 2011

DOI

10.1017/s1431927611009032

ISSN

1431-9276