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Effects of accelerating voltage and thickness on...
Journal article

Effects of accelerating voltage and thickness on the signal-to-noise ratio in Electron Energy Loss Spectroscopy (EELS)

Abstract

The advantages of medium accelerating voltages (200-400KV) for EELS have been considered to be an improved jump ratio of edges and an improved signal to background ratio for an increased range of thiknesses. However, very little experimental data of the Signal to Noise Ratio (SNR) as a function of incident electron energy (E o

Authors

Botton G; L′Espérance G

Journal

Microscopy and Microanalysis, Vol. 47, , pp. 414–415

Publisher

Cambridge University Press (CUP)

Publication Date

August 6, 1989

DOI

10.1017/s0424820100154044

ISSN

1431-9276