Journal article
The Effect of Local Symmetry on Atomic Resolution EELS Near-Edge Structures: Predictions for Grain Boundaries In NiAl
Abstract
Abstract It has been demonstrated that electron energy loss spectrometry (EELS) can be used to probe the electronic structure of materials on the near-atomic scale. The electron energy loss near edge structure (ELNES) observed after the onset of a core edge reflects a weighted local density of final states to which core electrons are excited by fast incident electrons. Lately ‘atomic resolution EELS’ and ‘column-by-column spectroscopy’ have …
Authors
Pankhurst DA; Botton GA; Humphreys CJ
Journal
Microscopy and Microanalysis, Vol. 6, No. S2, pp. 186–187
Publisher
Oxford University Press (OUP)
Publication Date
August 1, 2000
DOI
10.1017/s1431927600033420
ISSN
1431-9276