Chapter
Multi-Component Model for Semiconductor Laser Degradation
Abstract
The physical mechanisms underlying semiconductor laser degradation are complicated and nonlinear. The observed aging behavior often possesses multiple failure modes that exhibit composite nonlinear trends over aging time. This complicated aging behavior leads to many proposed device-specific and failure mode-specific aging laws that are, in large measure, empirical in nature and often contradictory. In this chapter, we review a multicomponent …
Authors
Lam SKK; Cassidy DT
Book title
Advanced Laser Diode Reliability
Pagination
pp. 51-78
Publication Date
January 1, 2021
DOI
10.1016/B978-1-78548-154-3.50002-1