Journal article
Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors with a Low-Temperature Polymeric Gate Dielectric on a Flexible Substrate
Abstract
Amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) with a solution-processed polymeric gate dielectric of cross-linked poly(4-vinylphenol) (c-PVP) film were fabricated on a poly(ethylene terephthalate) (PET) substrate on which an a-IGZO film, as the active channel layer, was deposited by radio frequency (RF) sputtering. The entire TFT fabrication process was carried out at a temperature below 110 °C. The device exhibited …
Authors
Hyung GW; Park J; Wang J-X; Lee HW; Li Z-H; Koo J-R; Kwon SJ; Cho E-S; Kim WY; Kim YK
Journal
Japanese Journal of Applied Physics, Vol. 52, No. 7R,
Publisher
IOP Publishing
Publication Date
July 1, 2013
DOI
10.7567/jjap.52.071102
ISSN
0021-4922