Ptychography at the carbon K-edge

Ptychography is a coherent diffraction imaging technique that measures diffraction patterns at many overlapping points on a sample and then uses an algorithm to reconstruct amplitude and phase images of the object and probe. Here, we report imaging, spectroscopy and linear dichroism ptychographic measurements at the carbon K-edge. This progress was achieved with a new generation of scientific Complementary Metal Oxide Semiconductor (sCMOS) …