EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan

Abstract One‐shot devices result in an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. The study of one‐shot device testing has been developed considerably recently, both in terms of estimation and optimal design under different lifetime distributions. However, one‐shot device testing analysis under lognormal lifetime distribution has not been studied yet. While the …