Constant-Stress Accelerated Life-Test Models and Data Analysis for One-Shot Devices

In reliability analysis, accelerated life-tests are commonly used for inducing rapid failures, thus producing more lifetime information in a relatively short period of time. A link function relating stress levels and lifetimes is then utilized to extrapolate lifetimes of units from accelerated conditions to normal operating conditions. In the context of one-shot device testing, encountered commonly in testing devices such as munitions, rockets, …