Journal article
Seeing structures and measuring properties with transmission electron microscopy images: A simple combination to study size effects in nanoparticle systems
Abstract
Authors
Donnadieu P; Lazar S; Botton GA; Pignot-Paintrand I; Reynolds M; Perez S
Journal
Applied Physics Letters, Vol. 94, No. 26,
Publisher
AIP Publishing
Publication Date
June 29, 2009
DOI
10.1063/1.3168525
ISSN
0003-6951