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Benefits of energy filtering for advanced...
Journal article

Benefits of energy filtering for advanced convergent beam electron diffraction patterns

Abstract

Energy filtering is well known to have a dramatic effect on the appearance of standard, zone-axis convergent beam electron diffraction patterns. In this paper, the effects of energy filtering on some less-common types of CBED patterns are shown. In particular, the (002) and (402) quasi-forbidden reflections in silicon are investigated, and the effects of energy filtering demonstrated. The filtering of HOLZ excess lines in large-angle zone-axis …

Authors

Burgess WG; Preston AR; Botton GA; Zaluzec NJ; Humphreys CJ

Journal

Ultramicroscopy, Vol. 55, No. 3, pp. 276–283

Publisher

Elsevier

Publication Date

September 1994

DOI

10.1016/0304-3991(94)90062-0

ISSN

0304-3991