Journal article
Benefits of energy filtering for advanced convergent beam electron diffraction patterns
Abstract
Energy filtering is well known to have a dramatic effect on the appearance of standard, zone-axis convergent beam electron diffraction patterns. In this paper, the effects of energy filtering on some less-common types of CBED patterns are shown. In particular, the (002) and (402) quasi-forbidden reflections in silicon are investigated, and the effects of energy filtering demonstrated. The filtering of HOLZ excess lines in large-angle zone-axis …
Authors
Burgess WG; Preston AR; Botton GA; Zaluzec NJ; Humphreys CJ
Journal
Ultramicroscopy, Vol. 55, No. 3, pp. 276–283
Publisher
Elsevier
Publication Date
September 1994
DOI
10.1016/0304-3991(94)90062-0
ISSN
0304-3991