Journal article
RF CMOS NOISE CHARACTERIZATION AND MODELING
Abstract
This paper presents a through description of radio frequency (RF) noise characterization and modeling of CMOS transistors. It begins with the definition of the four noise parameter of a two-port network - minimum noise figure (NF
min
Authors
CHEN C-H; DEEN MJ
Journal
International Journal of High Speed Electronics and Systems, Vol. 11, No. 04, pp. 1085–1157
Publisher
World Scientific Publishing
Publication Date
December 2001
DOI
10.1142/s0129156401001064
ISSN
0129-1564