Chapter One Measurement Techniques and Issues

This chapter introduces the measurement techniques and setups suitable for place in millimeter-wave measurements and characterizations of test structures, devices, circuits or systems. A detailed description of measurements to be made on mm-wave circuits including direct current biasing, scattering parameters, and calibration and deembedding are described. A detailed description of mm-wave network analyzers and various forms of signal analyses is provided. In mm-wave measurements, calibration and de-embedding are vital as the parasitics can dominate the device characteristics. For persons working in measurements, this chapter is a treasure-chest of useful information.