Chapter
Chapter One Measurement Techniques and Issues
Abstract
This chapter introduces the measurement techniques and setups suitable for place in millimeter-wave measurements and characterizations of test structures, devices, circuits or systems. A detailed description of measurements to be made on mm-wave circuits including direct current biasing, scattering parameters, and calibration and deembedding are described. A detailed description of mm-wave network analyzers and various forms of signal analyses …
Authors
Deen MJ; Marinov O
Book title
Silicon-Based Millimeter-wave Technology - Measurement, Modeling and Applications
Series
Advances in Imaging and Electron Physics
Volume
174
Pagination
pp. 1-117
Publisher
Elsevier
Publication Date
2012
DOI
10.1016/b978-0-12-394298-2.00001-6