Journal article
Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test
Abstract
Authors
Balakrishnan N; Castilla E; Martn N; Pardo L
Journal
IEEE Transactions on Reliability, Vol. 70, No. 4, pp. 1355–1367
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2021
DOI
10.1109/tr.2021.3062289
ISSN
0018-9529