Nanoscale chemical analysis of beam‐sensitive polymeric materials by cryogenic electron microscopy

Abstract Nanoscale chemical analysis of functional polymer systems by electron microscopy, to gain access into degradation processes during the materials life cycle, is still a formidable challenge due to their beam sensitivity. Here a systematic study on the different stages of degradation in a P3HT‐PCBM organic photovoltaic (OPV) model system is presented. To this end pristine samples, samples with (reversibly) physisorbed oxygen and water …