Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses

Abstract Introduced robust density‐based estimators in the context of one‐shot devices with exponential lifetimes under a single stress factor. However, it is usual to have several stress factors in industrial experiments involving one‐shot devices. In this paper, the weighted minimum density power divergence estimators (WMDPDEs) are developed as a natural extension of the classical maximum likelihood estimators (MLEs) for one‐shot device …