Journal article
Measurement of Indium-Content Variation in InGaN/GaN Dot-in-a-Wire Nanostructures by Electron Energy-Loss Spectroscopy
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Authors
Woo S; Gauquelin N; Botton G; Turner S; Mi Z
Journal
Microscopy and Microanalysis, Vol. 18, No. S2, pp. 1820–1821
Publisher
Oxford University Press (OUP)
Publication Date
July 2012
DOI
10.1017/s1431927612010951
ISSN
1431-9276