Journal article
Dielectric and ellipsometric studies of the dynamics in thin films of isotactic poly(methylmethacrylate) with one free surface
Abstract
A detailed study on thin films of i-PMMA was performed using dielectric loss measurements and ellipsometry. By studying supported films on the same substrate material, it was possible to make detailed comparisons between dielectric loss measurements and ellipsometrically determined Tg values. The temperature corresponding to the peak in the 1-kHz dielectric loss was found to be independent of film thickness. Al coated samples were also studied …
Authors
Sharp JS; Forrest JA
Journal
Physical Review E Statistical Nonlinear and Soft Matter Physics, Vol. 67, No. 3 1,
Publication Date
March 1, 2003
ISSN
1063-651X