Journal article
The role of structural defects in the growth of nickel oxide films
Abstract
A transmission electron microscopy investigation was made of the structural defects in nickel oxide films formed at 500° and 600°C on metallographically polished polycrystalline nickel. These films within the thickness range 500–3000 Å were composed of small crystallites. For a given film orientation, the crystallites increased in size with increasing oxidation time. This increase in crystallite size may be considered as a recrystallization …
Authors
Perrow JM; Smeltzer WW; Embury JD
Journal
Acta Metallurgica, Vol. 16, No. 10, pp. 1209–1218
Publisher
Elsevier
Publication Date
October 1968
DOI
10.1016/0001-6160(68)90002-3
ISSN
0001-6160