Linear and nonlinear spectroscopy at a cesium vapour/dielectric interface using a semiconductor laser

Linear and nonlinear spectroscopy on the Cs (6s2S12-6p2P32) transition at 852 nm is performed at a cesium vapour/dielectric interface. Two reflection phenomena are studied: selective reflection in a linear laser-atom interaction regime, and saturation spectroscopy in the evanescent wave. The spectral narrowing of selective reflection is observed as a function of angle in the range from near-normal incidence to the critical angle. The …