Journal article
Nitrogen implantation into GaP: Damage and nitrogen location studies
Abstract
Implantations of 80 and 40 keV nitrogen into GaP have been carried out. The implants were performed at temperatures from 25° to 400°C for total doses in the range 1015 to 10l6 cm−2. Backscattering and channeling techniques have been used to determine the associated damage and its annealing characteristics for temperatures up to 800°C . Also determined, has been the lattice location of the implanted nitrogen. This was performed by implanting …
Authors
Thompson DA; Johar SS; Shewchun J
Journal
Journal of Electronic Materials, Vol. 4, No. 2, pp. 195–207
Publisher
Springer Nature
Publication Date
April 1975
DOI
10.1007/bf02655401
ISSN
0361-5235