Journal article
Quality evaluation of homopetaxial 4H-SiC thin films by a Raman scattering study of forbidden modes
Authors
Wan L; Zhao D; Wang F; Xu G; Lin T; Tin C-C; Feng Z; Feng ZC
Journal
Optical Materials Express, Vol. 8, No. 1,
Publisher
Optica Publishing Group
Publication Date
January 1, 2018
DOI
10.1364/ome.8.000119
ISSN
2159-3930