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Robust estimators for one-shot device testing data...
Journal article

Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

Abstract

Due to its flexibility, gamma distribution is commonly used for lifetime data analysis in reliability and survival studies, and especially in one-shot device testing data. In the study of such data, inducing more failures by accelerated life tests is a common practice, to obtain more lifetime information within a relatively short period of time. In this paper, we develop weighted minimum density power divergence estimators, as a natural …

Authors

Balakrishnan N; Castilla E; Martín N; Pardo L

Journal

Metrika, Vol. 82, No. 8, pp. 991–1019

Publisher

Springer Nature

Publication Date

November 2019

DOI

10.1007/s00184-019-00718-5

ISSN

0026-1335

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