Journal article
Short-Circuit Fault Diagnosis for Three-Phase Inverters Based on Voltage-Space Patterns
Abstract
This paper introduces a fault detection and isolation (FDI) method for faulty metaloxidesemiconductor field-effect transistors in a three-phase pulsewidth-modulated (PWM) voltage source inverter. Short-circuit switch faults are the leading cause of failure in power converters. It is extremely vital to detect them in the early stages to prevent unwanted shutdown and catastrophic failures in motor drives and power generation systems. Against the …
Authors
Alavi M; Wang D; Luo M
Journal
IEEE Transactions on Industrial Electronics, Vol. 61, No. 10, pp. 5558–5569
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2014
DOI
10.1109/tie.2013.2297298
ISSN
0278-0046