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Recent advances in Transmission Electron...
Journal article

Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation

Authors

Donnadieu P; Shao Y; Botton G; Lazar S; Cheynet M; De Geuser F; Deschamps A; Douin J; Gatel C; Houdellier F

Journal

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