Journal article
Applications of spherical aberration correction in STEM and TEM
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Authors
Lazar S; Etheridge J; Dwyer C; Freitag B; Botton G
Journal
Microscopy and Microanalysis, Vol. 16, No. S2, pp. 68–69
Publisher
Oxford University Press (OUP)
Publication Date
July 2010
DOI
10.1017/s1431927610058034
ISSN
1431-9276