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Investigation of hexagonal and cubic GaN by...
Journal article

Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory

Abstract

High-resolution electron energy-loss spectroscopy in a transmission electron microscope is a very powerful method for the study of electronic structure of materials. The fine structure of Ga L(2,3) and N ionization edges in c-GaN and h-GaN was studied using a TEM equipped with a monochromator and high-resolution energy spectrometer. The experimental results were compared with the results of calculation based on the density functional theory …

Authors

Lazar S; Hébert C; Zandbergen HW

Journal

Ultramicroscopy, Vol. 98, No. 2-4, pp. 249–257

Publisher

Elsevier

Publication Date

January 2004

DOI

10.1016/j.ultramic.2003.08.018

ISSN

0304-3991