Journal article
Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theory
Abstract
High-resolution electron energy-loss spectroscopy in a transmission electron microscope is a very powerful method for the study of electronic structure of materials. The fine structure of Ga L(2,3) and N ionization edges in c-GaN and h-GaN was studied using a TEM equipped with a monochromator and high-resolution energy spectrometer. The experimental results were compared with the results of calculation based on the density functional theory …
Authors
Lazar S; Hébert C; Zandbergen HW
Journal
Ultramicroscopy, Vol. 98, No. 2-4, pp. 249–257
Publisher
Elsevier
Publication Date
January 2004
DOI
10.1016/j.ultramic.2003.08.018
ISSN
0304-3991