New Insight into the Role of the Interfacial Molecular Structure on Growth and Scaling in Organic Heterostructures

In this combined atomic force microscopy and X-ray diffraction study, we explore the microscopic origin of the scaling properties of the growth of organic−organic heterostructures formed here by F16CoPc and diindenoperylene (DIP) molecules as representative systems for electron and hole transporting materials. We evaluate the influence of the morphological properties of the first organic layer (DIP) on further temporal evolution of the morphology and structure of F16CoPc films. From the derived scaling exponents, we conclude that the morphology evolution is dominated by mound formation. The microscopic origin of such morphology is ascribed to structural changes occurring during the first stages of F16CoPc growth as revealed by grazing incidence X-ray diffraction (GIXD). The microstructure of organic materials should be taken into account, the challenging task of modeling growing surfaces and interfaces of organic materials.