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Logistic Localized Modeling of the Sample Space...
Journal article

Logistic Localized Modeling of the Sample Space for Feature Selection and Classification

Abstract

Conventional feature selection algorithms assign a single common feature set to all regions of the sample space. In contrast, this paper proposes a novel algorithm for localized feature selection for which each region of the sample space is characterized by its individual distinct feature subset that may vary in size and membership. This approach can therefore select an optimal feature subset that adapts to local variations of the sample space, …

Authors

Armanfard N; Reilly JP; Komeili M

Journal

IEEE Transactions on Neural Networks and Learning Systems, Vol. 29, No. 5, pp. 1396–1413

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication Date

5 2018

DOI

10.1109/tnnls.2017.2676101

ISSN

2162-237X