Journal article
Logistic Localized Modeling of the Sample Space for Feature Selection and Classification
Abstract
Conventional feature selection algorithms assign a single common feature set to all regions of the sample space. In contrast, this paper proposes a novel algorithm for localized feature selection for which each region of the sample space is characterized by its individual distinct feature subset that may vary in size and membership. This approach can therefore select an optimal feature subset that adapts to local variations of the sample space, …
Authors
Armanfard N; Reilly JP; Komeili M
Journal
IEEE Transactions on Neural Networks and Learning Systems, Vol. 29, No. 5, pp. 1396–1413
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
5 2018
DOI
10.1109/tnnls.2017.2676101
ISSN
2162-237X