Journal article
Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy
Authors
Shankar S; Riddle YW; Makhlouf MM
Journal
Metallurgical and Materials Transactions A, Vol. 34, No. 3, pp. 705–707
Publisher
Springer Nature
Publication Date
January 1, 2003
DOI
10.1007/s11661-003-0105-1
ISSN
1073-5623