Experts has a new look! Let us know what you think of the updates.

Provide feedback
Home
Scholarly Works
XPS and EELS characterization of Mn2SiO4, MnSiO3...
Journal article

XPS and EELS characterization of Mn2SiO4, MnSiO3 and MnAl2O4

Abstract

X-ray Photoelectron Spectroscopy (XPS) and Electron Energy Loss Spectroscopy (EELS) are strong candidate techniques for characterizing steel surfaces and substrate-coating interfaces when investigating the selective oxidation and reactive wetting of advanced high strength steels (AHSS) during the continuous galvanizing process. However, unambiguous identification of ternary oxides such as Mn2SiO4, MnSiO3, and MnAl2O4 by XPS or EELS, which can …

Authors

Grosvenor AP; Bellhouse EM; Korinek A; Bugnet M; McDermid JR

Journal

Applied Surface Science, Vol. 379, , pp. 242–248

Publisher

Elsevier

Publication Date

8 2016

DOI

10.1016/j.apsusc.2016.03.235

ISSN

0169-4332